An ADAS HiL test system will be the highlight of SET’s booth. It allows for efficient assessment of devices under test (DUT), reducing test time and costs as well as increasing reliability by replacing complex real-world tests with a real-time virtual equivalent. The ADAS HIL test platform is based on off-the-shelf components from trusted manufacturers such as National Instruments.
The system can be easily tailored to specific and diverse applications, as standardized modules from the ADAS iiT toolbox can be configured for a customized test system. National Instruments’ hardware is open and transparent, and can be extended with different I/Os and bus systems like CAN, FlexRay, LIN and BroadR-Reach. Furthermore, this hardware platform works perfectly with the ADAS iiT toolbox, thanks to the latter’s standardized framework based on NI LabVIEW and Veristand.